Hybrid IC with circuit for burn-in test

Details Hybrid IC with circuit for burn-in test Hybrid IC with circuit for burn-in test

1998-06-19

2000-12-05

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 3102

Patent

active

061572020

ABSTRACT:
A hybrid IC with a semiconductor power device and a control circuit for controlling the power device being bare-chip mounted on a substrate includes a wiring arranged between a power source line and a gate of the power device whereby the wiring connects the power source line to the gate during a burn-in test and is cut off after the burn-in test. The hybrid IC preferably provides a wiring pattern for disconnecting the control circuit to the gate of the power device during a burn-in test which is shortcircuited after the burn-in test.

REFERENCES:
patent: 5393991 (1995-02-01), Kawakami

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