Automatic temperature and humidity regulation – Humidity control
Patent
1995-11-21
1997-09-23
Wayner, William E.
Automatic temperature and humidity regulation
Humidity control
165222, 219401, 374 14, G01N 2500, B01F 302
Patent
active
056695543
ABSTRACT:
The humidity of the atmosphere contacting a sample and the water vapor partial pressure are program controlled and measured in a device having: a sample chamber which is provided with an inlet and an outlet for water vapor and which is capable of controlling a feedback temperature along with the sample stored therein; a warm water chamber for generating saturated water vapor pressure which has a gas inlet and an outlet connected to a pipe and which is capable of controlling the feedback temperature; a humidity program function generator for outputting a target humidity value for the sample chamber for each input time interval; a memory for storing a temperature-saturated water vapor pressure curve; and a calculator for calculating a control target temperature for the warm water chamber for generating the saturated water vapor pressure on the basis of the sample chamber target temperature output from a temperature program function generator, sample chamber target humidity of the sample chamber output from the humidity program function generator and the temperature-saturated water vapor pressure curve.
REFERENCES:
patent: 3110442 (1963-11-01), Taylor
patent: 3292417 (1966-12-01), Hayden et al.
patent: 3825723 (1974-07-01), Roeser
Kinoshita Ryoichi
Nakamura Nobutaka
Seiko Instruments Inc.
Wayner William E.
LandOfFree
Humidity control thermal analyzer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Humidity control thermal analyzer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Humidity control thermal analyzer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1936842