Measuring and testing – Instrument proving or calibrating – Span or set point adjustment
Patent
1998-02-09
1999-09-07
Raevis, Robert
Measuring and testing
Instrument proving or calibrating
Span or set point adjustment
G01D 1800
Patent
active
059489600
ABSTRACT:
A handler throw measuring unit (HTMU) for calibrating a test handler that handles an integrated circuit package. The throw measuring unit includes a plurality of pogo pins that are coupled to a base plate and a spring plate. The pogo pins are deflected when a test handler pushes the spring plate. The HTMU has a gauge that is coupled to the spring plate to measure the amount of pogo pin deflection. The amount of deflection can be provided on a numerical readout. An operator can incrementally move the test handler until the readout provides a desired value.
REFERENCES:
patent: 5103572 (1992-04-01), Ricklefs
patent: 5253428 (1993-10-01), McMurtry
patent: 5269067 (1993-12-01), Waeldele et al.
patent: 5665897 (1997-09-01), Lippmann et al.
Birk Tom
Langmack John
Schroeder Chris
Intel Corporation
Raevis Robert
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