Hot-electron programmable latch for integrated circuit fuse appl

Details Hot-electron programmable latch for integrated circuit fuse appl Hot-electron programmable latch for integrated circuit fuse appl

1998-06-26

2000-03-14

Le, Vu A.

Static information storage and retrieval

Floating gate

Particular connection

36518505, 365154, 365156, G11C 700

Patent

active

06038168&

ABSTRACT:
A method and apparatus for conditioning an integrated circuit to always enter a desired operating state when actuated by permanently altering at least one component device. An integrated circuit is provided with at least one component transistor wherein a constant high voltage is applied only once to the drain electrode of the transistor for one predetermined period of time while concurrently a constant voltage lower than the high voltage is applied only once to the gate electrode of the transistor, thus causing a permanent channel hot-electron alteration of a gate oxide of the transistor. The integrated circuit may include a plurality of programmable circuits, each capable of assuming a plurality of readable data states when powered up, and each including a plurality of programmable devices for permanently biasing its corresponding programmable circuit to assume one of the readable states upon subsequent power ups.

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Programable Compare Circuit, K.E. Beilstein, R.A. Lipa IBM Technical Disclosure Bulletin, Aug. 1987, No. 280.

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