Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2007-05-15
2007-05-15
Knight, Anthony (Department: 2121)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C716S030000, C716S030000
Reexamination Certificate
active
09969186
ABSTRACT:
The present invention is directed to methods for reliability simulations in aged circuits whose operation has been degraded through hot-carrier or other effects by allowing design rules on degradation to be included in the netlist. Once the hot-carrier circuit simulation is launched, the rules are checked and the reliability design rule violations are reported. The process can be performed on either the layout or schematic window. The design rule criteria can be any device parameter and can be expressed in absolute or relative terms. The criteria can be based on device type, model card name, instance geometry, or temperature. Additionally, values can be set prior to beginning the simulation.
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Chen Alvin I.
Choi Jeong Y.
Fang Jingkun
Wu Lifeng
Cadence Design Systems Inc.
Knight Anthony
Parsons Hsue & de Runtz LLP
Stevens Tom
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