Homodyne interferometric receiver and calibration method having

Details Homodyne interferometric receiver and calibration method having Homodyne interferometric receiver and calibration method having

1995-09-05

1997-09-02

Font, Frank G.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356357, G01B 902

Patent

active

056637934

ABSTRACT:
A method and system for measuring the phase difference between two orthogonally polarized components of a test beam as well as the intensities of these two components. A partially-polarizing beamsplitter (101) divides a polarized test beam (103) into first and second spatially-separated beams (154,104). The first beam (154) passes through a wave plate (160) oriented so as to retard the phase of the s polarization component with respect to the p polarization component. The first beam (154) then passes through a first polarizing beamsplitter (155), to produce a first pair of spatially separated output beams (156,157) with mutually-orthogonal linear polarizations. The second beam (104) is likewise passed through a second polarizing beamsplitter (105) to produce a second pair of linearly-polarized output beams (106,107). Photodetectors (108,109,158,159) send an electrical signals proportional to the intensities of the beams (106,107,156,157) to a computer (99). The computer (99) calculates the phase difference between the s and p polarization components of the test beam, as well as the relative intensities of the s and p polarization components of the test beam. The invention also provides methods and means for calibrating the inventive apparatus using polarizing elements (52,53,54) and a beam block (51). The calibration procedure determines the phase retardance of the wave plate (155), the polarizing characteristics of the partially-polarizing beamsplitter (101), and the electrical characteristics of each of the photodetectors (108.109,158,159).

REFERENCES:
patent: 4798468 (1989-01-01), Ohuchi
patent: 4842408 (1989-06-01), Yoshii et al.
patent: 5018862 (1991-05-01), Aiello
patent: 5243649 (1993-09-01), Franson
patent: 5374991 (1994-12-01), Atkinson et al.
patent: 5392116 (1995-02-01), Makosch
A. Dorsey, R. J. Hocken, M. Horowitz, "A low cost laser interferometer system for machine tool applications" (Precision Eng. 5 p. 29, 1983).
R. Smythe, R. Moore, "Instantaneous phase measuring interferometry" (Proc. Soc. Phot. Opt. Instr. Eng. 429 p. 16, 1983).
V. Greco, G. Molesini, F. Quercioli, "Accurate polarization interferometer" (Rev. Sci. Instrum. 66 p. 3729, 1994).
P.L.M. Heydemann, "Determination and correction of quadrature infringe measurement errors in interferometers" (Appl. Opt. 20 p. 3382, 1981).

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