Holomoire strain analyzer

Optics: measuring and testing – Material strain analysis – By light interference detector

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356347, 356359, G01B 902

Patent

active

056710429

ABSTRACT:
A system and process for the measurement of strains in objects using holographic interferometry comprising a continuous point light source for illuminating the object, a fringe stabilizer for compensating for the vibratory motion of the object, a detector for capturing a holographic image, a rigid body motion compensator for compensating for the rigid body motion of the object caused by displacement of the object upon application of a force, and an electronic system for reconstructing the holographic image to permit comparison of the object before and after application of a force.

REFERENCES:
patent: 3503690 (1970-03-01), Sciammarella
patent: 3860346 (1975-01-01), Kersch et al.
patent: 3985444 (1976-10-01), Takashima et al.
patent: 4436419 (1984-03-01), Stetson et al.
patent: 4591996 (1986-05-01), Vachon
patent: 4722600 (1988-02-01), Chiang
patent: 4794550 (1988-12-01), Greivenkamp, Jr.
patent: 4850693 (1989-07-01), Deason et al.
patent: 5020904 (1991-06-01), McMahan, Jr.
Sciammarella, C.A. et al., "Measurement of Strains at High Temperatures by Means of Electro-optics Holography", Illinois Institute of Technology, Department of Mechanical and Aerospace Engineering, Chicago, Illinois 60616, Jun. 1991.
Sciammarella, C.A. et al., "Electro-optical System for the Non-destructive Evaluation of Bioengineering Materials", SPIE Proceedings of the International Conference on Biomedical Optics, Jan. 20-25, 1991, Los Angeles, Laboratory of Experimental Mechanics of Materials, Department of Mechanical and Aerospace Engineering, Illinois Institute of Technology, Chicago, Illinois, 60616, Jan. 20, 1991.
Sciammarella, C.A., et al., "Measurement of Strains by Means of Electro-optics Holography", Proceedings of SPIE's Optical Engineering Midwest, Sep. 27, 28, 1990, Illinois Institute of Technology, Department of Mechanical and Aerospace Engineering, Chicago, Illinois 60616.
Sciammarella, C.A., et al., "An Optical Technique to Measure Micro Displacements", Proceedings of the Conference on Applied Stress Analysis, Aug. 30-31, 1990, University of Nottingham, U.K., Illinois Institute of Technology, Department of Mechanical and Aerospace Engineering, Chicago, Illinois 60616.
Sciammarella, C.A., et al., "An Electro-optical System to Measure Strains", 5th International Conference on Experimental Mechanics, Proceedings of the Conference, Aug. 20-24, 1990, Copenhagen, Denmark, Department of Mechanical and Aerospace Engineering, Illinois Institute of Technology, Chicago, Illinois 60616.
Sciammarella, C.A., et al., "Measurement of Residual Stresses by the Moire Method", Proceedings of the SEM Spring meeting of Jun. 1990, Illinois Institute of Technology, Department of Mechanical and Aerospace Engineering, Chicago, Illinois 60616.
Sciammarella, C.A., et al., "Electro-optical System to Measure Strains", SECTAM XV, Mar. 22-23, 1990, Atlanta, Georgia, Theoretical and Applied Mechanics, vol. 15.
Sciammarella, C.A., et al., "A High Accuracy Micromechanics Displacement Measurement Optical Technique", American Society of Mechanical Engineers, vol. 102, Micromechanics: Experimental Techniques, 1989.
Sciammarella, C.A., et al., "Measurement of Strains at High Temperature by Means of a Portable Holographic Moire Camera", Hostile Environment and High Temperature Measurements, SEM, Nov. 6-8, 1989, Illinois Institute of Technology, Chicago, Illinois 60616.
Sciammarella, C.A. and Gilbert, J.A., "A Holographic-Moire Technique to Obtain Separate Patterns for Components of Displacement," Experimental Mechanics, vol. 16, No. 6, 1976.
Gilbert, J.A., Sciammarella, C.A. and Chawla, S.K., "Extension to Three-Dimensions of Holographic-Moire Technique to Separate Patterns Corresponding to Components of Displacement," Experimental Mechanics, vol. 18 (9), 1978.
Sciammarella, C.A. and Chawla, S.K., "A Lens Holographic-Moire Technique to Obtain Components of Displacements and Derivatives," Experimental Mechanics, vol. 18, (10), 1978.
Sciammarella, C.A. and Ahmadshahi, M.A., "A Computer Based Holographic Interferometry to Analyze 3-D Surfaces," Proceedings of 11 Triennial World Congress of IMEKO, Houston, Texas, 1988.
Sciammarella, C.A., Sainov, V. and Simova, E., "Holographic Moire Contouring," Proceedings of Holography 1989, International Conference on Holography, Optical Recording and Processing of Information, Varna, Bulgaria, SPIE, vol. 1183, 1989.
Sciammarella, C.A., "Holographic-Moire," Proceedings of the I.U.T.A.M. Optical Methods in Mechanics of Solids, Poitiers, France, 1979.
Sciammarella, C.A., Rastogi, P., Jacquot, P. and Narayanan, R., "Holographic-Moire Real Time Observation," Experimental Mechanics, vol. 22 (2), 1982.
Sciammarella, C.A., "Holographic-Moire, an Optical Tool for Determination of Displacements, Strains, Contours and Slopes of Surfaces," Optical Engineering, vol. 21 (3), 1982.
Sciammarella, C.A. and Narayanan, R., "The Determination of the Components of the Strain Tensor in Holographic Interferometry," Experimental Mechanics, vol. 24 (9), 1984.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Holomoire strain analyzer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Holomoire strain analyzer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Holomoire strain analyzer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1940344

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.