Holographic interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection

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356363, G01B 9021

Patent

active

047830557

ABSTRACT:
A method and apparatus for testing an optical system 64 having an optical axis and a desired optical wavefront. A hologram is formed containing a recording of the desired optical wavefront. The hologram is located on the optical axis. When the hologram 50 is played back, the desired optical wavefront 62 is produced and directed toward the optical system 64. Wavefront 62 is retroreflected from the optical system 64 containing any of the system's aberrations. The retroreflected wavefront 66 is then passed through the hologram. A reference wavefront 60 is produced which is substantially conjugate to the desired optical wavefront. The reference wavefront 60 interferes with the retroreflected desired optical wavefront 66 thereby producing an interference fringe pattern characterizing the optical system under test.

REFERENCES:
patent: 3672776 (1972-06-01), Brooks
patent: 3828126 (1974-08-01), Ramsey, Jr.
patent: 3953129 (1976-04-01), Hildebrand
patent: 3997266 (1976-12-01), Hildebrand
patent: 4396289 (1983-08-01), Fantone
J. C. Wyant, "Holographic and Moire Techniques", Optical Shop Testing, Chapter 12, pp. 381-389.

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