Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-07-03
2007-07-03
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
10510778
ABSTRACT:
A holder supported by an arm comprises a metallic reinforcing member and a plastic holder hole forming member filled in an opening formed in the reinforcing member. Holder holes are formed in the holder hole forming member, and a coil spring and electroconductive needle members are installed in each holder hole to thereby provide a contact probe having two moveable ends. Because the holder is essentially made of the metallic member, the mechanical strength of the holder can be improved over that formed strictly from plastic material. Therefore, the contact probe holder would not suffer from dimensional changes of the holder owing to aging compounded by temperature changes for testing (tests under high temperature conditions) and residual stress so that the change in the pitch of the holder holes can be avoided, and a high level of precision can be ensured. Therefore, the contact probe allows tests to be conducted in a stable manner over an extended period of time.
REFERENCES:
patent: 5819410 (1998-10-01), Furusawa et al.
patent: 6255832 (2001-07-01), Notohardjono et al.
patent: 6337572 (2002-01-01), Kazama
patent: 6894515 (2005-05-01), Okano et al.
patent: 7157922 (2007-01-01), Kazama
patent: 2005/0258843 (2005-11-01), Kazama
patent: 60-168062 (1985-08-01), None
patent: 60-154868 (1985-10-01), None
patent: 7-225245 (1995-08-01), None
patent: 8-201427 (1996-08-01), None
patent: 8-271547 (1996-10-01), None
patent: 11-108954 (1999-04-01), None
patent: 11-281673 (1999-10-01), None
patent: 2001-223247 (2001-08-01), None
patent: WO 00/03250 (2000-01-01), None
English Language Abstract, Japanese Publication No. 60-168062, Published Aug. 31, 1985, 1 p.
English Lanugage Summary, Japanese Publication No. 60-154868, Published Oct. 15, 1985, 1 p.
English Language Abstract, Japanese Publication No. 7-225245, Published Aug. 22, 1995, 1 p.
English Language Abstract, Japanese Publication No. 8-201427, Published Aug. 9, 1996, 1 p.
English Language Abstract, Japanese Publication No. 8-271547, Published Oct. 18, 1996, 1 p.
English Language Abstract, Japanese Publication No. 11-108954, Published Apr. 23, 1999, 1 p.
English Language Abstract, Japanese Publication No. 11-281673, Published Oct. 15, 1999, 1 p.
English Language Abstract, Japanese Publication No. 2001-223247, Published Aug. 17, 2001, 1 p.
Microfilm of the specification and drawings annexed to the request of Japanese Utility Model Application No. 36820/1989 (Laid-open No. 128961/1990) (Tsuneo Kasahara), Oct. 24, 1990, Fig. 1.
Microfilm of the specification and drawings annexed to the request of Japanese Utility Model Application No. 93110/1990 (Laid-open No. 51663/1992) (Organ Needle Co., Ltd.), Apr. 30, 1992, Fig. 8.
Kazama Toshio
Nagaya Mitsuhiro
Sotoma Hiroyasu
MacPherson Kwok & Chen & Heid LLP
Nguyen Ha Tran
NHK Spring Co. Ltd.
Park David S.
Velez Roberto
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