Optics: measuring and testing – For size of particles – By particle light scattering
Patent
1988-09-13
1990-01-16
Willis, Davis L.
Optics: measuring and testing
For size of particles
By particle light scattering
250574, 356343, G01N 1502, G01N 2153
Patent
active
048939285
ABSTRACT:
A detection device is disclosed for determining particle size from particle effected light scattering in a sensing region illuminated by a laser beam and receiving the particles in a medium, such as air. Background light from molecular scattering is reduced to a level that enables light scattered by particles having a size of at least as low as about 0.1 micron to be sensed in a high background of molecular scattering such as, for example, where molecular scattering can exceed the 0.1 micron particle's scattering by one hundred times. High sensitivity at high molecular scattering background is achieved through use of a linear array of detectors positioned, with respect to an imaging system, so that each detector monitors a different portion of the sensing region and provides an electrical output signal indicative of sensed particle presence within that portion monitored, with the output signals from the detectors being parallel processed and with the output signals from detectors monitoring non-adjacent portions of the sensing region being combined at noise cancellation units.
REFERENCES:
patent: 3822095 (1974-07-01), Hirschfeld
patent: 3941982 (1976-03-01), Knollenberg et al.
patent: 4173415 (1979-11-01), Wyatt
patent: 4571079 (1986-02-01), Knollenberg
"The Measurement of Particle Sizes Below 0.1 Micrometers", By Robert G. Knollenberg, The Journal of Environmental Sciences, Jan./Feb. 1985.
"Sizing Particles at High Sensitivity in High Molecular Scattering Environments", by Dr. Robert G. Knollenberg, Proceedings--Institute of Environmental Sciences, 1987.
Harris Robert E.
Koren Mathew W.
Particle Measuring Systems, Inc.
Willis Davis L.
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