Highly resilient cantilever spring probe for testing ICs

Details Highly resilient cantilever spring probe for testing ICs Highly resilient cantilever spring probe for testing ICs

2005-10-18

2005-10-18

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010

Reexamination Certificate

active

06956389

ABSTRACT:
A probe has a cantilever arm coupled to a base via an anchor. A surface of the arm facing the base or a surface of the base facing the arm has steps with contact points that contact the base when the arm is depressed. Alternatively, the surface of the arm and/or the surface of the base may be curved.

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patent: 6014032 (2000-01-01), Maddix et al.
patent: 6027630 (2000-02-01), Cohen
patent: 6218203 (2001-04-01), Khoury et al.
patent: 6414501 (2002-07-01), Kim et al.
patent: 6482013 (2002-11-01), Eldridge et al.

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