Highly conductive composition for wafer coating

Compositions – Electrically conductive or emissive compositions

Reexamination Certificate

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Details

C252S512000, C252S514000, C075S252000, C257S768000, C361S502000, C438S689000

Reexamination Certificate

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07422707

ABSTRACT:
A conductive composition for coating a semiconductor wafer comprises conductive filler that has an average particle size of less than 2 microns and a maximum particle size of less than 10 microns, a first resin that has a softening point between 80-260° C., solvent, curing agent, and a second resin, wherein at room temperature the first resin is substantially soluble in the solvent.

REFERENCES:
patent: 3716489 (1973-02-01), DeLapp
patent: 4552691 (1985-11-01), Shoji et al.
patent: 4564563 (1986-01-01), Martin et al.
patent: 4714726 (1987-12-01), Ketley
patent: 4933030 (1990-06-01), Dietz
patent: 4946376 (1990-08-01), Sharma et al.
patent: 5003018 (1991-03-01), Repecka
patent: 5011627 (1991-04-01), Lutz et al.
patent: 5165877 (1992-11-01), Colin
patent: 5391604 (1995-02-01), Dietz et al.
patent: 5488082 (1996-01-01), Dietz et al.
patent: 5504374 (1996-04-01), Oliver et al.
patent: 5536970 (1996-07-01), Higashi et al.
patent: 5728775 (1998-03-01), Narisawa et al.
patent: 5747615 (1998-05-01), Repecka
patent: 5856425 (1999-01-01), Rosenfeld et al.
patent: 5897813 (1999-04-01), Titomir et al.
patent: 5955566 (1999-09-01), Lee et al.
patent: 6140402 (2000-10-01), Dietz et al.
patent: 6175162 (2001-01-01), Kao et al.
patent: 6265471 (2001-07-01), Dietz
patent: 6313248 (2001-11-01), Boyd et al.
patent: 6313428 (2001-11-01), Chen et al.
patent: 6995202 (2006-02-01), Lake, Jr. et al.
patent: 6995205 (2006-02-01), Matsukawa et al.
patent: 7186945 (2007-03-01), He et al.
patent: 2003/0162368 (2003-08-01), Connell et al.
patent: 2004/0106291 (2004-06-01), Ho et al.
patent: 2004/0145060 (2004-07-01), Dominic
patent: 2005/0268963 (2005-12-01), Jordan et al.
patent: 2006/0021465 (2006-02-01), Uchida
patent: 2008/0089012 (2008-04-01), Kon et al.
patent: 10-060111 (1998-03-01), None
patent: WO 96/13066 (1996-05-01), None
patent: WO 01/80312 (2001-10-01), None

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