Highly compressible representation of test pattern data

Details Highly compressible representation of test pattern data Highly compressible representation of test pattern data

1997-01-07

1999-05-18

Black, Thomas G.

Data processing: database and file management or data structures

Database design

Data structure types

707100, G06F17/30

Patent

active

059059869

ABSTRACT:
A method for more efficient handling of data used in testing electronic integrated circuits and boards consisting of specifying data in a flat tabular format. Signal data are contained in columns and cycle data are contained in rows. Any given signal in a cycle will typically be a "0" or "1". If a signal does not change from one cycle to the next, the character "0" or "1" is replaced in the latter cycle by the dot "." character. As a result of the "." character replacements, the data is much more highly compressible by standard compression software than before, thus requiring less storage space for the data.

REFERENCES:
patent: 4464650 (1984-08-01), Eastman et al.
patent: 5025396 (1991-06-01), Parks et al.
patent: 5128737 (1992-07-01), Van Der Have
patent: 5546575 (1996-08-01), Potter et al.
patent: 5703581 (1997-12-01), Matias et al.
"Submicron CMOS/BICMOS Gate Arrays", Release 2.0, Engineering Newsletter published by Texas Instruments, Oct. 1992.

Affiliated with

Also associated with

Rating

Highly compressible representation of test pattern data does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Highly compressible representation of test pattern data, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Highly compressible representation of test pattern data will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1769171