Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Patent
1998-06-08
1999-09-21
Sherry, Michael J.
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
361111, H02H 322
Patent
active
059562196
ABSTRACT:
Clamp circuitry capable of providing ESD protection to a high voltage supply connection is provided. The clamp circuitry increases the area efficiency of ESD power supply clamping circuitry to sink larger currents during an ESD event, while maintaining backward compatibility with the higher voltage requirements of older ICs. The voltage clamp circuits include two discharge transistors which are controlled by a control circuit. The control circuit couples the gates of the discharge transistors to ground during an ESD event.
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Merrill, R., et al., "ESD Design Methodology", Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 6 pages (Sep. 28-30, 199)
Wann, C., et al., "High-Performance 0.07-um CMOS with 9.5-ps Gate Delay and 150 GHz ft", IEEE Electron Device Letters, vol. 18, No. 12, pp. 625-627, (Dec. 1997).
Worley, E.R., et al., "Sub-micron Chip ESD Protection Schemes Which Avoid Avalanching Junctions", EOS/ESD Symposium, 9 pages, (Sep. 1995).
Intel Corporation
Sherry Michael J.
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