Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-11-06
2007-11-06
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S072500, C702S064000
Reexamination Certificate
active
11503926
ABSTRACT:
The present invention provides a high-voltage measuring device capable of providing sufficient electric isolation between resistors and between resistors and a voltage measurement circuit without necessity of enlarging a size of a substrate for carry thereon the circuit. A high-voltage measuring device mounted on a substrate, including a high-voltage input terminal pair, a measuring terminal pair, a voltage measuring circuit having input terminals connected to the measuring terminal pair, and two resistive parts. One of the resistive parts electrically connects one of high-voltage input terminal pair and one of measuring terminal pair. The other of resistive parts electrically connects between the other of high-voltage input terminal pair and the other of measuring terminal pair. Each of the resistive parts includes a series circuit of at least one high resistance resistor and at least one low resistance resistor, and a distance between the high resistance resistors in each of the resistive parts is larger than that between the low resistance resistors.
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Abe Seiichiro
Chiba Takeshi
Katanoda Tomoya
Suzuki Koji
Takebayashi Kenichi
Deb Anjan
Keihin Corporation
Nguyen Hoai-An D.
Westerman, Hattori, Daniels & Adrian , LLP.
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