High voltage isolation semiconductor capacitor digital...

Wave transmission lines and networks – Long line elements and components – Strip type

Reexamination Certificate

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Reexamination Certificate

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07741935

ABSTRACT:
According to one embodiment, there is provided a semiconductor digital communication device comprising communication drive and sense electrodes formed in a single plane, where the electrodes have relatively high sidewalls. The relatively high sidewalls permit low electrical field densities to be obtained in the sense and drive electrodes during operation, and further permit very high breakdown voltages to be obtained between the electrodes, and between the drive electrode and an underlying ground plane substrate. The device effects communications between drive and receive circuits through the drive and sense electrodes by capacitive means, and in a preferred embodiment is capable of effecting relatively high-speed digital communications. The device may be formed in a small package using, by way of example, CMOS or other semiconductor fabrication and packaging processes.

REFERENCES:
patent: 4799092 (1989-01-01), Klaassen
patent: 4989127 (1991-01-01), Wegener
patent: 5530277 (1996-06-01), Otsuki et al.
patent: 5561393 (1996-10-01), Sakurai et al.
patent: 5625265 (1997-04-01), Vlahu
patent: 5693971 (1997-12-01), Gonzalez
patent: 5945728 (1999-08-01), Dobkin et al.
patent: 6137827 (2000-10-01), Scott
patent: 6167475 (2000-12-01), Carr
patent: 6215377 (2001-04-01), Douriet et al.
patent: 6320532 (2001-11-01), Diede
patent: 7136274 (2001-11-01), Diede
patent: 6489850 (2002-12-01), Heineke et al.
patent: 6538313 (2003-03-01), Smith
patent: 6563211 (2003-05-01), Fukada et al.
patent: 6574091 (2003-06-01), Heineke et al.
patent: 6583681 (2003-06-01), Makino et al.
patent: 6583976 (2003-06-01), Murahashi et al.
patent: 6661079 (2003-12-01), Bikulcius
patent: 6944009 (2005-09-01), Nguyen et al.
patent: 6960945 (2005-11-01), Bonin
patent: 7016490 (2006-03-01), Beutler et al.
patent: 7170807 (2007-01-01), Franzen et al.
patent: 7331723 (2008-02-01), Yoon et al.
patent: 7379037 (2008-05-01), Takeuchi et al.
patent: 7394337 (2008-07-01), Arai et al.
patent: 2006/0095639 (2006-05-01), Guenin et al.
patent: 2007/0008679 (2007-01-01), Takahasi et al.
patent: 2007/0025123 (2007-02-01), Kim et al.
patent: 2007/0133933 (2007-06-01), Yoon et al.
patent: 2007/0162645 (2007-07-01), Han et al.
patent: 2008/0179963 (2008-07-01), Fouquet et al.
patent: WO 2005/001928 (2005-06-01), None
patent: WO-2005/001928 (2005-06-01), None
U.S. Appl. No. 11/264,956, filed Nov. 1, 2005, Guenin et al.
ACCL-9xxx 3.3V/5V High Speed CMOS Capacitive Isolator, Preliminary Datasheet, Avago Technologies, Date unknown.
Texas Instruments Dual Digital Isolators, SLLS755E, Jul. 2007.

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