High-voltage integrated vertical resistor and manufacturing...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

Reexamination Certificate

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C257S508000, C257S520000, C257S543000, C257S572000

Reexamination Certificate

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07053463

ABSTRACT:
The manufacturing process comprises the steps of growing epitaxially a first layer from a semiconductor material substrate, forming in the first layer a first and a second buried region spaced from one another and having conductivity of the type opposite that of the first layer; growing epitaxially on the first layer a second layer of semiconductor material having the same type of conductivity as the first layer; forming in the second layer a trench extending in depth beyond the buried regions, arranged between the buried regions, and having, in plan view, a frame shape; forming an oxide layer covering the lateral walls and the base wall of the trench; and filling the remaining part of the trench with an isolating material. By this means, the portion of the second layer surrounded by the trench defines a first high-voltage resistor having a vertical structure and current flow, whereas the portion of the first layer arranged below the trench defines a second high-voltage resistor arranged in series with the first high-voltage resistor, and also having a vertical structure and current flow.

REFERENCES:
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patent: 4933739 (1990-06-01), Harari
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patent: 5825067 (1998-10-01), Takeuchi et al.
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patent: 6030898 (2000-02-01), Liu
patent: 6373100 (2002-04-01), Pages et al.
patent: 6696916 (2004-02-01), Sanfilippo et al.
patent: 61-232657 (1986-10-01), None
patent: 6-342878 (1994-12-01), None
patent: 06342878 (1994-12-01), None

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