High voltage field mapping apparatus and method

Details High voltage field mapping apparatus and method High voltage field mapping apparatus and method

1981-12-04

1986-02-18

Levy, Stewart J.

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

324 96, 324109, 324457, G01R 528

Patent

active

045715394

ABSTRACT:
Apparatus and method for mapping an existing electric field involve exposing a field responsive element to the electric field to produce movement of the element in the path of a light beam, and detecting modulation of the light beam by the element. In a preferred embodiment the light beam is passed to and from the field responsive element by optical waveguides.

REFERENCES:
patent: 2505420 (1950-04-01), McCrary et al.
patent: 3513391 (1970-05-01), Heinrich et al.
patent: 3781092 (1973-12-01), Sussman et al.
patent: 3851248 (1974-11-01), Spokas
patent: 3924184 (1975-12-01), Spokas
patent: 4071753 (1978-01-01), Fulenwider et al.
patent: 4147979 (1979-04-01), Baues et al.
patent: 4368430 (1983-01-01), Dale et al.
patent: 4376248 (1983-03-01), Gialloreni et al.
patent: 4386315 (1983-05-01), Young et al.
J. McCann, "AC Probe Potential Measurement", Ontario Hydro Research Division Report, Jan. 1980.
K. Horii, et al., "Mechanical Resonance Type AC Potentiometer", Bul. Electrotech. Lab., vol. 33, No. 9, Japan, 1969.

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