High voltage driver circuit with fast current limiting for testi

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Details

324 731, 371 27, G01R 1900, G06F 1700

Patent

active

054935199

ABSTRACT:
A circuit that provides for digitally programmable high voltage drive, as well as fast current limiting capability for testing of integrated circuits. The circuit also provides for digitally programmable slew rate control for controlling the rise and fall times of an output voltage. Integrated circuits requiring low voltage and high voltage tests at different speeds and with different current limiting conditions, or low and high current forcing with different voltage clamp levels, or a mixture of the two can be tested in a single continuous test pattern using the circuit of the present invention.

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patent: 4605894 (1986-08-01), Cox et al.
patent: 4637020 (1987-01-01), Schinabeck
patent: 4646299 (1987-02-01), Schinabeck et al.
patent: 4896244 (1990-01-01), Kalina
patent: 5010297 (1991-04-01), Babcock

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