High-voltage device structure

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device

Reexamination Certificate

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C257S347000, C257S358000, C257S361000, C257S363000, C257S379000, C257S546000, C257S757000, C438S183000, C438S151000, C438S165000, C438S200000, C438S275000

Reexamination Certificate

active

07061029

ABSTRACT:
A high-voltage device structure disposed in a substrate of a first conductivity type includes a first well and a second well each of a second conductivity type, a source diffusion region and a drain diffusion region each of a first length located in the first well and the second well respectively, and a gate of a second length on the substrate surface. Since the gate of the second length is longer than the source diffusion region and the drain diffusion region of the first length, the two sides of the gate have two spare regions. Two windows are located in the spare regions.

REFERENCES:
patent: 5061981 (1991-10-01), Hall
patent: 5801426 (1998-09-01), Okamura
patent: 5990522 (1999-11-01), Okamura
patent: 6265251 (2001-07-01), Jun et al.
patent: 2002/0060343 (2002-05-01), Gauthier et al.
patent: 2003/0102513 (2003-06-01), Gauthier et al.

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