Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device
Reexamination Certificate
2006-06-13
2006-06-13
Le, Dung (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
C257S347000, C257S358000, C257S361000, C257S363000, C257S379000, C257S546000, C257S757000, C438S183000, C438S151000, C438S165000, C438S200000, C438S275000
Reexamination Certificate
active
07061029
ABSTRACT:
A high-voltage device structure disposed in a substrate of a first conductivity type includes a first well and a second well each of a second conductivity type, a source diffusion region and a drain diffusion region each of a first length located in the first well and the second well respectively, and a gate of a second length on the substrate surface. Since the gate of the second length is longer than the source diffusion region and the drain diffusion region of the first length, the two sides of the gate have two spare regions. Two windows are located in the spare regions.
REFERENCES:
patent: 5061981 (1991-10-01), Hall
patent: 5801426 (1998-09-01), Okamura
patent: 5990522 (1999-11-01), Okamura
patent: 6265251 (2001-07-01), Jun et al.
patent: 2002/0060343 (2002-05-01), Gauthier et al.
patent: 2003/0102513 (2003-06-01), Gauthier et al.
Hsu Wei-Lun
Lee Wen-Fang
Lin Yu-Hsien
Le Dung
Nguyen Tram H.
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