High voltage A.C. test set for measuring true leakage current

Details High voltage A.C. test set for measuring true leakage current High voltage A.C. test set for measuring true leakage current

1977-02-09

1979-02-27

Strecker, Gerard R.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

324 62, G01R 3102, G01R 3112, G01R 2700

Patent

active

041421426

ABSTRACT:
High voltage testing apparatus producing A.C. test voltages across test probes produces electrical indications truly representative of only resistance in-phase currents flowing through a device being tested even though such device may be capacitive in addition to resistive in nature. Eliminated from such indications are effects otherwise due to quadrature capacitive currents. A transistor is connected between the test probes and is rendered alternatively conductive and nonconductive during succeeding half cycles of the A.C. voltage and such transistor is connected in conjunction with a meter which "samples" the voltage appearing between the test probes only during a first half cycle of the A.C wave during which the positive and negative portions of the quadrature capacitive current average out to a zero flow and thus have no effect on the meter. During the second half cycle of the A.C. wave the meter is effectively short-circuited by the transistor and is thus rendered insensitive.

REFERENCES:
patent: 2916697 (1959-12-01), Boode
patent: 2977531 (1961-03-01), Humes et al.
patent: 3040249 (1962-06-01), Schwarckopf et al.
patent: 3201776 (1965-08-01), Morrow et al.
patent: 3227953 (1966-01-01), Cerveny
patent: 3286130 (1966-11-01), Clinton
patent: 3399399 (1968-08-01), Apfelbaum
patent: 3678376 (1972-07-01), Jaster et al.
patent: 3777259 (1973-12-01), Clinton
patent: 3914687 (1975-10-01), Bevins
Carlson, Elmer C., "Semiconductor Circuit Tester . . . Model 250," Radio-Electronics, vol. 36, No. 4, Apr. 1965, p. 70.

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