High-throughput testing apparatus

Details High-throughput testing apparatus High-throughput testing apparatus

1994-08-30

1996-12-03

Voeltz, Emanuel T.

Boots, shoes, and leggings

364579, 371 27, G05B 1900

Patent

active

055814913

ABSTRACT:
A testing apparatus for testing a multiplicity of electronic devices, in particular integrated circuits, comprises means for two-fold processing of symbolic test data. In one mode, a fast pass/fail test may be executed by data. In one mode, a fast pass/fail test may be executed by once transforming the pass/fail test-related symbolic data into executable data and downloading them into a test data memory. Repeated pass/fail tests may then be executed. In the second mode, the symbolic test data are transformed and downloaded every time the test is performed, which makes execution slower, but allows modification and value tests.

REFERENCES:
patent: 5046033 (1991-09-01), Andreasen et al.
patent: 5243603 (1993-09-01), Broeren
patent: 5311486 (1994-05-01), Alton et al.
patent: 5336944 (1994-08-01), Fischer
patent: 5381417 (1995-01-01), Loopik et al.
patent: 5410681 (1995-04-01), Jessen et al.
patent: 5453995 (1995-09-01), Behrens
A Combinational Board Test System, 1266 Hewlett-Packard Journal, 38 (1987) Dec., No. 11, Palo Alto, CA., USA pp. 53-57 Search Report (3 pages).

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