High throughput surface plasmon resonance analysis system

Details High throughput surface plasmon resonance analysis system High throughput surface plasmon resonance analysis system

1999-07-06

2000-08-29

Font, Frank G.

Optics: measuring and testing

Of light reflection

356369, 250216, 250225, 250239, G01N 2155, H01J 314

Patent

active

061116521

ABSTRACT:
An apparatus and method for high throughput surface plasmon resonance (SPR) sensor subarray comprising two or more SPR sensor subarrays (10) having a target layer on an SPR layer (22), wherein the SPR sensor subarrays (10) are exposed to a solution until a baseline measurement is attained, is disclosed. Once the SPR sensor subarrays (10) have attained baseline, the SPR sensor subarrays (10) are used to determine the interaction properties between said SPR sensor subarray and a test entity.

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patent: 5485277 (1996-01-01), Foster
patent: 5492840 (1996-02-01), Malmqvist et al.
patent: 5898503 (1999-04-01), Keller et al .
patent: 5912456 (1999-06-01), Melendez et al.

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