High throughput mechanical rapid serial property testing of...

Measuring and testing – Liquid analysis or analysis of the suspension of solids in a... – Surface tension

Reexamination Certificate

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C073S064480, C073S064510, C073S826000, C073S863010, C073S864910

Reexamination Certificate

active

06857309

ABSTRACT:
A library of materials is screened for mechanical properties such as surface tension or interfacial tension. A library of materials is provided. A stimulus such as a stress or force is provided to each member of the library. A response (e.g., a resistance) of each of the materials due to the stimulus is measured and the response, the stimulus or both are recorded and related to provide data. Thereafter, the data is analyzed to reach conclusions regarding the material samples.

REFERENCES:
patent: 1870412 (1932-08-01), Kennedy
patent: 3071961 (1963-01-01), Heigl et al.
patent: 3675475 (1972-07-01), Weinstein
patent: 3713328 (1973-01-01), Aritomi
patent: 3798960 (1974-03-01), Glass
patent: 3805598 (1974-04-01), Corcoran
patent: 3818751 (1974-06-01), Karper et al.
patent: 3849874 (1974-11-01), Jeffers
patent: 3895513 (1975-07-01), Richardson
patent: 3908441 (1975-09-01), Virloget
patent: 3933032 (1976-01-01), Tschoegl
patent: 4229979 (1980-10-01), Greenwood
patent: 4447125 (1984-05-01), Lazay et al.
patent: 4517830 (1985-05-01), Gunn et al.
patent: 4567774 (1986-02-01), Manahan et al.
patent: 4570478 (1986-02-01), Soong
patent: 4599219 (1986-07-01), Cooper et al.
patent: 4602501 (1986-07-01), Hirata
patent: 4605589 (1986-08-01), Orphanides
patent: 4680958 (1987-07-01), Ruelle et al.
patent: 4685328 (1987-08-01), Huebner et al.
patent: 4699000 (1987-10-01), Lashmore et al.
patent: 4715007 (1987-12-01), Fujita et al.
patent: 4740078 (1988-04-01), Daendliker et al.
patent: 4749854 (1988-06-01), Martens
patent: 4789236 (1988-12-01), Hodor et al.
patent: 4793174 (1988-12-01), Yau
patent: 4829837 (1989-05-01), Telfer
patent: 4893500 (1990-01-01), Fink-Jensen
patent: 4899575 (1990-02-01), Chu et al.
patent: 4899581 (1990-02-01), Allen et al.
patent: 4914966 (1990-04-01), White, Jr. et al.
patent: 4932270 (1990-06-01), Lurie et al.
patent: 4975320 (1990-12-01), Goldstein et al.
patent: 5008081 (1991-04-01), Blau et al.
patent: 5051239 (1991-09-01), von der Goltz
patent: 5092179 (1992-03-01), Ferguson
patent: 5115669 (1992-05-01), Fuller et al.
patent: 5142900 (1992-09-01), Duke
patent: 5193383 (1993-03-01), Burnham et al.
patent: 5236998 (1993-08-01), Lundeen et al.
patent: 5269190 (1993-12-01), Kramer et al.
patent: 5271266 (1993-12-01), Eschbach
patent: 5272912 (1993-12-01), Katsuzaki
patent: 5280717 (1994-01-01), Hoseney et al.
patent: 5303030 (1994-04-01), Abraham et al.
patent: 5305633 (1994-04-01), Weissenbacher et al.
patent: 5365776 (1994-11-01), Lehmann et al.
patent: 5398885 (1995-03-01), Andersson et al.
patent: 5437192 (1995-08-01), Kawamoto et al.
patent: 5438863 (1995-08-01), Johnson
patent: 5452614 (1995-09-01), Kato et al.
patent: 5452619 (1995-09-01), Kawanabe et al.
patent: 5481153 (1996-01-01), Turner
patent: 5517860 (1996-05-01), Lin et al.
patent: 5520042 (1996-05-01), Garritano et al.
patent: 5532942 (1996-07-01), Kitamura et al.
patent: 5610325 (1997-03-01), Rajagopal et al.
patent: 5626779 (1997-05-01), Okada
patent: 5699159 (1997-12-01), Mason
patent: 5700953 (1997-12-01), Hlady et al.
patent: 5723792 (1998-03-01), Miyazaki
patent: 5728532 (1998-03-01), Ackley
patent: 5756883 (1998-05-01), Forbes
patent: 5764068 (1998-06-01), Katz et al.
patent: 5776359 (1998-07-01), Schultz et al.
patent: 5817947 (1998-10-01), Bergerus
patent: 5821407 (1998-10-01), Sekiguchi et al.
patent: 5847268 (1998-12-01), Ball
patent: 5847283 (1998-12-01), Finot et al.
patent: 5877428 (1999-03-01), Scolton
patent: 5892157 (1999-04-01), Syre
patent: 5922967 (1999-07-01), Motoyama
patent: 5959297 (1999-09-01), Weinberg et al.
patent: 5985356 (1999-11-01), Schultz et al.
patent: 5999887 (1999-12-01), Giannakopoulos et al.
patent: 6004617 (1999-12-01), Schultz et al.
patent: 6010616 (2000-01-01), Lewis et al.
patent: 6013199 (2000-01-01), McFarland et al.
patent: 6024925 (2000-02-01), Little et al.
patent: 6030917 (2000-02-01), Weinberg et al.
patent: 6033913 (2000-03-01), Morozov et al.
patent: 6034240 (2000-03-01), La Pointe
patent: 6034775 (2000-03-01), McFarland et al.
patent: 6040193 (2000-03-01), Winkler et al.
patent: 6043317 (2000-03-01), Mumick et al.
patent: 6043363 (2000-03-01), LaPointe et al.
patent: 6045671 (2000-04-01), Wu et al.
patent: 6050138 (2000-04-01), Lynch et al.
patent: 6050139 (2000-04-01), Bousfield et al.
patent: 6087181 (2000-07-01), Cong
patent: 6092414 (2000-07-01), Newman
patent: 6124476 (2000-09-01), Guram et al.
patent: 6149882 (2000-11-01), Guan et al.
patent: 6151123 (2000-11-01), Nielsen
patent: 6157449 (2000-12-01), Hajduk
patent: 6175409 (2001-01-01), Nielsen et al.
patent: 6177528 (2001-01-01), LaPointe et al.
patent: 6182499 (2001-02-01), McFarland et al.
patent: 6187164 (2001-02-01), Warren et al.
patent: 6203726 (2001-03-01), Danielson et al.
patent: 6225487 (2001-05-01), Guram
patent: 6225550 (2001-05-01), Hornbostel et al.
patent: 6230548 (2001-05-01), Han et al.
patent: 6242623 (2001-06-01), Boussie et al.
patent: 6248540 (2001-06-01), Weinberg et al.
patent: 6260407 (2001-07-01), Petro et al.
patent: 6265226 (2001-07-01), Petro et al.
patent: 6265601 (2001-07-01), Guram et al.
patent: 6268513 (2001-07-01), Guram et al.
patent: 6294388 (2001-09-01), Petro
patent: 6296771 (2001-10-01), Miroslav
patent: 6306658 (2001-10-01), Turner et al.
patent: 6315923 (2001-11-01), Devenney et al.
patent: 6326090 (2001-12-01), Schultz et al.
patent: 6336353 (2002-01-01), Matsiev et al.
patent: 6393895 (2002-05-01), Matsiev et al.
patent: 6393898 (2002-05-01), Hajduk et al.
patent: 198 45 867 (1999-07-01), None
patent: 0 317 356 (1989-05-01), None
patent: 0 406 413 (1991-01-01), None
patent: 1 158 290 (2001-11-01), None
patent: 402297040 (1990-12-01), None
patent: WO 9313400 (1993-07-01), None
patent: WO 9611878 (1996-04-01), None
patent: WO 9815501 (1998-04-01), None
patent: WO 9918431 (1999-04-01), None
patent: WO 0017413 (2000-03-01), None
patent: WO 0023921 (2000-04-01), None
patent: WO 0036410 (2000-06-01), None
patent: WO 0040331 (2000-07-01), None
patent: WO 0051720 (2000-09-01), None
patent: WO 0067086 (2000-11-01), None
patent: WO 0122058 (2001-03-01), None
patent: WO 0153798 (2001-07-01), None
patent: WO 0179949 (2001-10-01), None
Woodward, Roger P., “A New Dynamic Contact Angle System (as presented at Pittcon 95)”, Fist Ten Angstroms, pp. 1-8.
Woodward, Ph.D., Roger P., “Contact Angle Measurements Using the Drop Shape Method”, First Ten Angstroms, pp. 1-8.
Woodward, Ph.D., Roger P., “Surface Tension Measurements Using the Drop Shape Method”, First Ten Angstroms, pp. 1-6.
Woodward, Ph.D., Roger P., “Dynamic Surface Tension and Dilational Stress Measurements Using the Drop Shape Method”, First Ten Angstroms, pp. 1-6.
Woodward, Ph.D., Roger P., “Two-Dimensional Contact Angle and Surface Tension Mapping (As presented at Pittcon 96)”, First Ten Angstrom, pp. 1-6.
Woodward, Ph.D., Roger P., “Prediction of Adhesion and Wetting from Lewis Acid Base Measurements (As presented at TPOs in Automotive 2000)”, First Ten Angstroms, pp. 1-6.
“FTA2000 Automated Surface Energy Analyzer”, Product Brief, First Ten Angstroms, Jun. 1998.
“Low Interfacial Tension Measurements”, Application Notes, First Ten Angstroms, Aug. 14, 2000.
“Sessile Drop Interfacial Tension Measurements”, Application Notes, First Ten Angstroms, Nov. 2, 2000.
“Influence of Drop's Volume on Contact Angle”, Application Notes, First Ten Angstroms, Aug. 15, 2000.
“A Simple Introduction to the Laplace Equation”, Application Notes, First Ten Angstroms, Dec. 11, 2000.
“Determining t=0 in Contact Angle Measurements”, Application Notes, First Ten Angstroms, Nov. 10, 1997.
“Contact Angle Accuracy”, Application Notes, First Ten Angstroms, Jun. 29, 1998.
“Do I Need a Contact Angle Analyzer?”, Application Notes, First Ten Angstroms, pp. 1-5.
“Dyne Solution Equivalents”, Application Notes, First Ten Angstroms, Aug. 17, 2000.
“Cleanliness Measurements Using Contact Angles”, Application Notes, First

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