Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1987-03-02
1988-11-15
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356358, G01B 902
Patent
active
047844906
ABSTRACT:
An optical system for an interferometer compensates for changes in temperature by incorporating optics in which the reference and measurement beams follow different but optically equivalent paths through optical elements that are in thermal equilibrium. The optical elements of the interferometer are so arranged that the reference beam and the measurement beam follow equivalent optical path lengths through the interferometer, whose elements are in thermal equilibrium. That is, the path lengths through the high refractive index media of the optics are the same length and refractive index, but do not follow the same path. Because the beams are not constrained to follow the same path, fewer optical elements are needed and shorter OPLs can be used resulting in less complexity, better optical efficiency, easier alignment and lower cost.
REFERENCES:
patent: 3788746 (1974-01-01), Baldwin et al.
patent: 4693605 (1987-09-01), Sommargren
Evans F. L.
Hewlett--Packard Company
Koren Matthew W.
Williams James M.
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