Electrical connectors – Contact tap between normally engaged coupling parts
Patent
1998-10-02
2000-02-22
Stephan, Steven L.
Electrical connectors
Contact tap between normally engaged coupling parts
324760, H01R 1302
Patent
active
060273542
ABSTRACT:
An apparatus for connecting an electronic device located in a high temperature environment, with a test unit located in a lower temperature environment, includes a ceramic fixturing plate that is formed with at least one hole. The apparatus also includes a metal spring conductor clip which has a first end and a second end. The first end of the conductor clip is selectively insertable into a hole of the fixturing plate to establish electrical contact with a lead from the electronic device being tested. At the same time, the second end of the conductor clip is engageable with the fixturing plate to hold the conductor clip on the plate. A wire, which is mechanically and electrically connected to the conductor clip, electrically connects the electronic device with the test unit that is located in the lower temperature environment.
REFERENCES:
patent: 3016512 (1962-01-01), Borchard
patent: 3673545 (1972-06-01), Rundle
patent: 4056299 (1977-11-01), Paige
patent: 4323842 (1982-04-01), McGarrity et al.
patent: 4467275 (1984-08-01), Maeda et al.
patent: 4508398 (1985-04-01), Stepan et al.
patent: 4676564 (1987-06-01), Mitchell, Jr.
patent: 4788490 (1988-11-01), Valaas
patent: 5099908 (1992-03-01), Taraci et al.
patent: 5406217 (1995-04-01), Habu
Bowers Kenneth D.
Leigh B. Lyle
Duverne J. F.
Micro Instrument Company
Stephan Steven L.
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