Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1986-06-06
1987-10-13
Myracle, Jerry W.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
G01B 718
Patent
active
046990100
ABSTRACT:
A device for measuring elongation of a structure includes mounts formed at least partially of electrically insulating ceramic material, the mounts having at least two points to be attached to a structure for shifting the mounts relative to each other upon elongation of the structure, and electrically conducting parts disposed on the mounts having electrical properties being influenced by the shifting of the mounts, at least a portion of each of the electrically conducting parts being subjected to mechanical stresses, and at least the portions of the electrically conducting parts being formed of electrically conductive ceramic material.
REFERENCES:
patent: 2481371 (1949-09-01), Van Dyke
patent: 3197335 (1965-07-01), Leszynski
patent: 3429020 (1969-02-01), Russell
patent: 4197753 (1980-04-01), Harting et al.
Klas Ernst
Schmidt Rudolf
Schumacher Gunther
Stausebach Dieter
Zentis Alfred
Greenberg Laurence A.
Interatom GmbH
Lerner Herbert L.
Myracle Jerry W.
LandOfFree
High-temperature resistant elongation measuring system formed of does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with High-temperature resistant elongation measuring system formed of, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High-temperature resistant elongation measuring system formed of will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-404755