High temperature range electrical circuit testing

Details High temperature range electrical circuit testing High temperature range electrical circuit testing

2007-10-12

2010-10-19

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S760020

Reexamination Certificate

active

07816930

ABSTRACT:
An electrical circuit testing assembly that includes a mechanical reference that is relatively stationary as compared to a circuit under test. A probe support assembly is coupled to the mechanical reference and includes probes for contacting interconnect pads on the circuit under test. Optionally, the probe support structure is attached to the mechanical reference via a column that is thermally resistive. Also optionally, a testing circuitry support structure (e.g., a printed circuit board) is not rigidly attached to the mechanical reference or to the probe support structure, thereby permitting the testing circuitry support structure to float with respect to the probe support structure.

REFERENCES:
patent: 5670889 (1997-09-01), Okubo et al.
patent: 6064215 (2000-05-01), Kister
patent: 6667631 (2003-12-01), Ivanov
patent: 6831455 (2004-12-01), Yonezawa
patent: 6894480 (2005-05-01), Back
patent: 7375542 (2008-05-01), Teneketges
patent: 7486089 (2009-02-01), Abe

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