Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1998-04-08
2000-05-16
Ballato, Josie
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324762, G01R 3102
Patent
active
060642157
ABSTRACT:
A probe card for testing integrated circuits which maintains rigidity and probe alignment at elevated temperatures. The probe card has a number of probes radially oriented on an insulating plate with a nonuniform radial distribution. The probes extend through an insulating ring. The nonuniform radial distribution of probes has gaps which allows for bolt or attachment to attach a rigid plate to the insulating ring. The insulating plate can be made of printed circuit board material, the insulating ring can be made of epoxy. The rigid plate can be made of stainless steel or any other material that maintains rigidity at elevated temperatures. Preferably, the insulating plate also has a stiffener ring located opposite the insulating ring on the top side. The bolts extend through the stiffener ring. The insulating plate has vias which allow the probes to be electrically connected to test electronics located above a top side of the insulating plate. The rigid plate maintains the rigidity of the apparatus and provides heat shielding for the insulating ring and insulating plate. Alternatively, the rigid plate is located above the insulating plate and bolted to the stiffener ring.
REFERENCES:
patent: 5123639 (1992-06-01), Carlin et al.
patent: 5355079 (1994-10-01), Evans et al.
patent: 5521523 (1996-05-01), Kimura et al.
patent: 5670889 (1997-09-01), Okubo et al.
patent: 5884395 (1999-03-01), Dabrowiecki et al.
Ballato Josie
Probe Technology, Inc.
Sundaram T. R.
LandOfFree
High temperature probe card for testing integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with High temperature probe card for testing integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High temperature probe card for testing integrated circuits will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-261498