High temperature open ended zero insertion force (ZIF) test...

Electrical connectors – With coupling movement-actuating means or retaining means in... – Including compound movement of coupling part

Reexamination Certificate

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Details

C439S912000

Reexamination Certificate

active

11306797

ABSTRACT:
A socket for use in testing packaged integrated circuits having leads depending therefrom includes a first member for receiving the integrated circuit package and having a plurality of holes for receiving leads extending from the package. A second member has a plurality of wire contacts for engaging the leads, the first and second members being arranged to permit relative lateral translation thereof. A support frame includes a first portion which physically engages the first member and a second portion which physically engages the second member. A lever or handle is attached to the second portion and includes a cam surface for engaging a cam follower on the first portion for imparting relative lateral motion between the two members whereby the package leads physically engage wires of the second member.

REFERENCES:
patent: 4478472 (1984-10-01), Baar
patent: 6168449 (2001-01-01), Huang et al.
patent: 6179640 (2001-01-01), Sikora et al.
patent: 6229320 (2001-05-01), Haseyama et al.
patent: 6565373 (2003-05-01), Cuevas
patent: 6896561 (2005-05-01), Lai
patent: 6953347 (2005-10-01), McGrath et al.

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