High temperature environmental testing apparatus for a semicondu

Details High temperature environmental testing apparatus for a semicondu High temperature environmental testing apparatus for a semicondu

1987-05-12

1989-07-25

Smith, Jerry

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

333247, G01R 3126, H01P 508

Patent

active

048517640

ABSTRACT:
An improved holding device for holding a semiconductor device, particularly a microwave semiconductor device, in a high temperature environmental testing apparatus. The holding device includes a heat block having a heat source therein, and a cooling block for cooling the microstrip matching circuits and coaxial connectors. Both blocks are spatially isolated from each other by an air space. The semiconductor device is set on the top surface of the heat block. As a result, the semiconductor device is effectively heated up to the predetermined testing temperature, while the microstrip matching circuits and the connectors are protected from the temperature rise caused by the heat flow from the heat block. Appropriate grounding arrangements for the semiconductor device are provided by a metal foil for projections on the side walls of the cooling block.

REFERENCES:
patent: 3775644 (1972-09-01), Cotner et al.
patent: 4365195 (1982-12-01), Stegens
patent: 4535307 (1985-08-01), Tsukii
patent: 4538124 (1985-08-01), Morrison
patent: 4574235 (1986-03-01), Kelly et al.
patent: 4707656 (1987-11-01), Marzan
Wilhemsen et al., "Temperature vs. Reliability in Power GaAS FETs and MIC GaAS FET Power Amplifiers", May 1984.
Omori et al., "Accelerated Active Life Test of GaAS FET and a New Failure Mode", Conf.: 18th Ann. Proc. of Reliability Physics, Apr. 1980, pp. 134-140.

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