High stability interferometer for measuring small changes in ref

Details High stability interferometer for measuring small changes in ref High stability interferometer for measuring small changes in ref

1990-02-05

1991-12-24

Turner, Samuel

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356361, G01B 902

Patent

active

050746669

ABSTRACT:
A high stability interferometer is capable of continuous measurement of small changes in the refractive index of a sample. The interferometer has a diffraction grating placed to be movable sideways or radially, and diffract laser light into beams which include +1, -1 and zero order beams. The diffraction grating is in the input plane of a Fourier Transform lens. The beams are brought to a focus in the output plane of the lens and are reflected back towards the lens by a mirror placed in the transform plane of the lens. The sample whose refractive index is to be measured is placed in the path of the +1 or -1 order beam, between the diffraction grating and the mirror.

REFERENCES:
patent: 3829219 (1974-08-01), Wyant
patent: 4733967 (1988-03-01), Sommargren

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