High speed phase detector and a method for detecting phase...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific signal discriminating without subsequent control – By phase

Reexamination Certificate

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Details

C327S007000, C327S003000, C327S002000

Reexamination Certificate

active

06181168

ABSTRACT:

FIELD OF THE INVENTION
A high-speed phase detector and a method for detecting phase difference, and specifically, a phase detector within a phase locked loop.
BACKGROUND OF THE INVENTION
Phase detectors are mainly used in phase locked loops PLLs. Phase detectors detect periodically the phase difference between an externally generated signal and a reference signal to produce an error signal indicating the phase difference between these two signals. The error signal is used to control the frequency of a voltage/current/digital controlled oscillator producing a signal with which the reference signal is synchronized, so as to bring the clock pulse signal into a predetermined phase or frequency relationship, with the external signal.
Both digital PLLs and mixed PLL use digital phase detectors. Digital phase detectors are known in the art for performing such phase detection. In a digital phase detector, the phase difference can be determined as a measure of the number of clock pulses that occur in the period of the received signal. However, this has the disadvantage that the resolution, that is the accuracy, with which the phase difference can be determined depends on the frequency of the clock pulses used.
U.S. Pat. No. 5,105,160 of Summers describes a phase detector that is adapted to operate in relatively low frequencies such as 15 Khz. The phase detector is comprised of a fine resolution analogue phase detector and a coarse resolution digital phase detector. Referring to
FIG. 1
, combining circuit
20
receives the output signals DES and AES provided by the digital phase detector and analog phase detector and combines DES and AES to produce a resultant digital output signal DPE. DPE represents an overall indication of the phase difference between an external signal VCS and reference signal PL.
The digital phase detector has an up/down counter
6
for counting clock pulses CPS to determine the number of clock pulses that occur in the time interval between opposite edges of a first signal VCS and one edge of a reference signal PL synchronized with the clock pulses CPS. A latch
7
provides a first digital output signal DES which represents the number.
The analogue phase detector circuit having a flip flop
13
for producing a second signal (VCS′) which corresponds to the first signal (VCS) and is synchronized with the clock pulses (CPS). Logic gates (XOR gate
9
and AND gate
10
) determine the time intervals between corresponding edges of the first and second signals (VCS,VCS′), and a circuit element determines a phase error voltage (VS) from these time intervals. The circuit element comprises of: capacitor
16
. Current source
14
for providing a first current I. A charge switch C_SW
17
, being controlled by logic circuit
12
, for allowing capacitor
16
to be charged by current I from current source
14
, during the time intervals between corresponding edges of the first and second signals to produce the phase error voltage across capacitor
16
. A discharge switch DC_SW
18
, being controlled by logic circuit
12
, for allowing capacitor
16
to be discharged, by a discharge current I/N provided by discharge current source
15
. The discharge ends when the voltage across capacitor
16
VC reaches a null value. An amplifier
11
is used to compare VC to 0 and notify logic circuit
12
when it occurs. Logic circuit
12
has a circuit for measuring the number of clock pulses CPS that occur during the discharge period and provide this count AES to combining logic
20
. The relation N between the two current sources causes the discharge period to be N times longer than the charge period—the time interval between corresponding edges of the first and second signals, thus providing a resolution that is N times better than the digital phase detector.
A disadvantage of this phase detector is that it is suited to operate in relatively low frequencies. This circuit can not operate in high and very high frequencies. For example, the discharge period, and accordingly the resolution of the analogue phase detector are limited by the frequency of the external signal VCS. In the preferred embodiment of the invention the frequency of VCS is about 15 Khz. Thus, such a phase detector can not be effective when VCS is a high frequency signal.
Furthermore, switching C_SW
17
and CS_SW
18
at high frequency and very high frequency results in a high noise level. Yet another disadvantage results from the digitizing of VS. Yet a further disadvantage of the phase detector is its complexity and it being comprised of several elements, like current sources and an amplifier, that their adaptation to operate in high frequencies is relatively expensive.


REFERENCES:
patent: 4380742 (1983-04-01), Hart
patent: 5079521 (1992-01-01), Gaskell et al.
patent: 5105160 (1992-04-01), Summers
patent: 5111151 (1992-05-01), Li
patent: 5168245 (1992-12-01), Koskowich
patent: 5173617 (1992-12-01), Alsup et al.
patent: 5268653 (1993-12-01), Lafon
patent: 5347234 (1994-09-01), Gersbach et al.
patent: 5349311 (1994-09-01), Mentzer
patent: 5382922 (1995-01-01), Gersbach et al.
patent: 5574455 (1996-11-01), Hori et al.
patent: 5625358 (1997-04-01), Wilson et al.
patent: 5654675 (1997-08-01), Bruccoleri et al.
patent: 5668503 (1997-09-01), Gersbach et al.
patent: 5727038 (1998-03-01), May et al.
patent: 5745533 (1998-04-01), Asada et al.
patent: 5748043 (1998-05-01), Koslov
patent: 5844447 (1998-12-01), Choi
patent: 5844954 (1998-12-01), Casasanta et al.
patent: 5856762 (1999-01-01), Werker et al.
patent: 5892406 (1999-04-01), Dicke et al.
patent: 5969552 (1999-10-01), Lee et al.

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