High speed optical image acquisition system with extended...

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C382S147000, C382S286000, C348S132000

Reexamination Certificate

active

07027639

ABSTRACT:
A high-speed image acquisition system includes a source of light; a sensor for acquiring a plurality of images of the target; a system for determining relative movement between the source and the target; and an image processor for processing the acquired images to generate inspection information relative to the target. The system has an extended dynamic range provided by controlling illumination such that the plurality of images is acquired at two or more different illumination levels. In some embodiments, the high-speed image acquisition system is used to perform three dimensional phase profilometry inspection.

REFERENCES:
patent: 2625856 (1953-01-01), Muller
patent: 3777061 (1973-12-01), Takemura
patent: 3995107 (1976-11-01), Woywood
patent: 4270863 (1981-06-01), Trogdon
patent: 4541010 (1985-09-01), Alston
patent: 4598321 (1986-07-01), Elabd et al.
patent: 4641972 (1987-02-01), Halioua et al.
patent: 4643565 (1987-02-01), Goto
patent: 4677473 (1987-06-01), Okamoto et al.
patent: 4782394 (1988-11-01), Hieda et al.
patent: 4835616 (1989-05-01), Morcom
patent: 4949172 (1990-08-01), Hunt et al.
patent: 4963024 (1990-10-01), Ulich
patent: 4984893 (1991-01-01), Lange
patent: 5039868 (1991-08-01), Kobayashi et al.
patent: 5069548 (1991-12-01), Boehnlein
patent: 5091963 (1992-02-01), Litt et al.
patent: 5103105 (1992-04-01), Ikegaya et al.
patent: 5135308 (1992-08-01), Kuchel
patent: 5278634 (1994-01-01), Skunes et al.
patent: 5298734 (1994-03-01), Kokubo
patent: 5307152 (1994-04-01), Boehnlein et al.
patent: 5406372 (1995-04-01), Vodanovic et al.
patent: 5424552 (1995-06-01), Tsuji et al.
patent: 5450204 (1995-09-01), Shigeyama et al.
patent: 5450228 (1995-09-01), Boardman et al.
patent: 5455870 (1995-10-01), Sepai et al.
patent: 5504596 (1996-04-01), Goto et al.
patent: 5546127 (1996-08-01), Yamashita et al.
patent: 5555090 (1996-09-01), Schmutz
patent: 5576829 (1996-11-01), Shiraishi et al.
patent: 5636025 (1997-06-01), Bieman et al.
patent: 5646733 (1997-07-01), Bieman
patent: 5668665 (1997-09-01), Choate
patent: 5684530 (1997-11-01), White
patent: 5686994 (1997-11-01), Tokura
patent: 5691784 (1997-11-01), Häusler et al.
patent: 5708532 (1998-01-01), Wartmann
patent: 5761337 (1998-06-01), Nishimura et al.
patent: 5774221 (1998-06-01), Guerra
patent: 5815275 (1998-09-01), Svetkoff et al.
patent: 5862973 (1999-01-01), Wasserman
patent: 5867604 (1999-02-01), Ben-Levy et al.
patent: 5878152 (1999-03-01), Sussman
patent: 5912984 (1999-06-01), Michael et al.
patent: 5917927 (1999-06-01), Satake et al.
patent: 5926557 (1999-07-01), King et al.
patent: 5953448 (1999-09-01), Liang
patent: 5969819 (1999-10-01), Wang
patent: 5982921 (1999-11-01), Alumot et al.
patent: 5982927 (1999-11-01), Koljonen
patent: 5991461 (1999-11-01), Schmucker et al.
patent: 5995232 (1999-11-01), Van Der Ven
patent: 5999266 (1999-12-01), Takahashi et al.
patent: 6028673 (2000-02-01), Nagasaki et al.
patent: 6061476 (2000-05-01), Nichani
patent: 6081613 (2000-06-01), Ikurumi et al.
patent: 6084712 (2000-07-01), Harding
patent: 6118524 (2000-09-01), King et al.
patent: 6180935 (2001-01-01), Hoagland
patent: 6201892 (2001-03-01), Ludlow et al.
patent: 6232724 (2001-05-01), Onimoto et al.
patent: 6268923 (2001-07-01), Michniewicz et al.
patent: 6269197 (2001-07-01), Wallack
patent: 6303916 (2001-10-01), Gladnick
patent: 6307210 (2001-10-01), Suzuki et al.
patent: 6445813 (2002-09-01), Ikurumi et al.
patent: 6496254 (2002-12-01), Bostrom et al.
patent: 6522777 (2003-02-01), Paulsen et al.
patent: 6603103 (2003-08-01), Ulrich et al.
patent: 40 11 407 (1991-10-01), None
patent: 19 511 160 (1995-03-01), None
patent: 0 453 977 (1991-10-01), None
patent: 0660 078 (1994-12-01), None
patent: WO 98/59490 (1998-06-01), None
patent: WO 99/12001 (1999-03-01), None
patent: WO 99/24786 (1999-05-01), None
patent: WO 0106210 (2001-01-01), None
patent: WO 0154068 (2001-07-01), None
patent: WO 02/01209 (2002-01-01), None
patent: WO 02/01210 (2002-01-01), None
U.S. Appl. No. 09/522,519, filed Mar. 10, 2000, Skunes et al.
U.S. Appl. No. 09/524,133, filed Mar. 10, 2000, Fishbaine et al.
U.S. Appl. No. 09/754,991, filed Jan. 5, 2001, Kranz et al.
Copy of International Search Report from Application No. PCT/US00/42760 with international filing date of Dec. 12, 2000.
Copy of International Search Report from Application No. PCT/US00/42764 with international filing date of Dec. 12, 2000.
Copy of International Search Report from Application No. PCT/US01/00330 with international filing date of May 1, 2001.
“Cognex and Sony Team Develops Machine-Vision Camera”,Vision Systems Design, p. 15 (Feb. 1999).
“3-D Profilometry Based on Modulation Measurement”, by Likun et al., vol. 19, No. 9, pp.1-11 (Sep. 1999).
“High Frame Rate Cameras”,Princeton Instruments Catalog of High Performance Digital CCD Cameras, 2 pages (Oct. 1994).
“Area Array CCD Image Sensor 1024×1024 Pixels with Antiblooming”, CCD Products, Thomson-CSF Semiconducteurs Specifiques, pp. 267-273 (1996).
“Accurate Machine Vision is the ‘Telecentric Advantage’”, 3 pages from website.
“Rank Order Morphological Hit-Miss Transform and Its Optical Implementation”, by Huiquan et al., Acta Optica Sinica, vol. 19, No. 9, pp. 1256-1263 (Sep. 1999). Translation provided.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

High speed optical image acquisition system with extended... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High speed optical image acquisition system with extended..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High speed optical image acquisition system with extended... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3582562

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.