High speed lead inspection system

Details High speed lead inspection system High speed lead inspection system

1994-02-18

2000-10-03

Lee, Richard

Television

Special applications

Manufacturing

348126, H04N 718

Patent

active

061280348

ABSTRACT:
An inspection system determines if leads of a semiconductor device are in proper positions. Images from at least two sides of the semiconductor device are captured along with calibration marks formed in the side of a track upon which the semiconductor device is mounted. All leads and calibration marks are captured in a single video image, the images from one side of the semiconductor device being off set from the image from the other side.

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