Optics: measuring and testing – Dimension – Width or diameter
Reexamination Certificate
2005-09-20
2005-09-20
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
Dimension
Width or diameter
C356S635000
Reexamination Certificate
active
06947152
ABSTRACT:
A large profile, high speed laser micrometer is formed from a light source unit comprised of a plurality of emitter modules that combine to emit a laser sheet and a detector array comprised of a plurality of detector modules. The laser micrometer also includes a data processing unit. Each of the emitter modules is aligned with a corresponding detector module such that an object passing between the light source unit and the detector array can be measured to an accuracy of at least 4/100ths of an inch.
REFERENCES:
patent: 4773029 (1988-09-01), Claesson et al.
patent: 4905512 (1990-03-01), Hayashi
patent: 5469262 (1995-11-01), Keen et al.
Cunha Adriano
Keightley John
Rechner Eric
3DM Devices Inc.
Stafira Michael P.
Thelen Reid & Priest
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