1993-02-08
1994-01-18
Atkinson, Charles E.
Excavating
371 165, 371 216, 371 226, G01R 3128
Patent
active
052804860
ABSTRACT:
An apparatus for processing failure information received from a node of a circuit under test. The apparatus includes a fail processor which receives test data from a node and generates failure data based upon the test data, a plurality of fail memories, each memory being configured to receive and store certain fail data, and a sequence memory configured-to store sequence information indicating in what order the failure data is stored in the plurality of fail memories.
REFERENCES:
patent: 4453213 (1984-06-01), Romagosa
patent: 4709366 (1987-11-01), Scott et al.
patent: 4817418 (1989-04-01), Asami et al.
patent: 4876685 (1989-10-01), Rich
Arkin Brian J.
Brown Benjamin J.
Reichert Peter A.
Atkinson Charles E.
Teradyne, Inc.
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