High speed electron tunneling devices

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Tunneling through region of reduced conductivity

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S031000, C257S032000

Reexamination Certificate

active

07105852

ABSTRACT:
A detector includes a voltage source for providing a bias voltage and first and second non-insulating layers, which are spaced apart such that the bias voltage can be applied therebetween and form an antenna for receiving electromagnetic radiation and directing it to a specific location within the detector. The detector also includes an arrangement serving as a transport of electrons, including tunneling, between and to the first and second non-insulating layers when electromagnetic radiation is received at the antenna. The arrangement includes a first insulating layer and a second layer configured such that using only the first insulating in the arrangement would result in a given value of nonlinearity in the transport of electrons while the inclusion of the second layer increases the nonlinearity above the given value. A portion of the electromagnetic radiation incident on the antenna is converted to an electrical signal at an output.

REFERENCES:
patent: 4163920 (1979-08-01), Lamb et al.
patent: 4272641 (1981-06-01), Hanak
patent: 4344052 (1982-08-01), Davidson
patent: 4442185 (1984-04-01), Skotheim
patent: 4857893 (1989-08-01), Carroll
patent: 4973858 (1990-11-01), Chang
patent: 5018000 (1991-05-01), Yamada et al.
patent: 5019530 (1991-05-01), Kleinsasser et al.
patent: 5056111 (1991-10-01), Duling, III et al.
patent: 5067788 (1991-11-01), Jannson et al.
patent: 5157361 (1992-10-01), Gruchalla et al.
patent: 5202752 (1993-04-01), Honjo
patent: 5208726 (1993-05-01), Apel
patent: 5302838 (1994-04-01), Roenker et al.
patent: 5326984 (1994-07-01), Rosencher et al.
patent: 5335361 (1994-08-01), Ghaem
patent: 5345231 (1994-09-01), Koo et al.
patent: 5362961 (1994-11-01), Hamanaka
patent: 5455451 (1995-10-01), Usagawa et al.
patent: 5543652 (1996-08-01), Ikeda et al.
patent: 5606177 (1997-02-01), Wallace et al.
patent: 5621222 (1997-04-01), Kimura
patent: 5621913 (1997-04-01), Tuttle et al.
patent: 5675295 (1997-10-01), Brebels et al.
patent: 5737458 (1998-04-01), Wojnarowski et al.
patent: 5751629 (1998-05-01), Nova et al.
patent: 5754948 (1998-05-01), Metze
patent: 5764655 (1998-06-01), Kiribara et al.
patent: 5796119 (1998-08-01), Seabaugh
patent: 5825049 (1998-10-01), Simmons et al.
patent: 5825240 (1998-10-01), Geis et al.
patent: 5883549 (1999-03-01), De Los Santos
patent: 5895934 (1999-04-01), Harvey et al.
patent: 5994891 (1999-11-01), Hubbell
patent: 6034809 (2000-03-01), Anemogiannis
patent: 6049308 (2000-04-01), Hietala et al.
patent: 6096496 (2000-08-01), Frankel
patent: 6110393 (2000-08-01), Simmons et al.
patent: 6121541 (2000-09-01), Arya
patent: 6181001 (2001-01-01), Ikefuji et al.
patent: 6195485 (2001-02-01), Coldren et al.
patent: 6211531 (2001-04-01), Nakazato et al.
patent: 6263193 (2001-07-01), Iseki et al.
patent: 6284557 (2001-09-01), Yiu et al.
patent: 6329655 (2001-12-01), Jack et al.
patent: 6373447 (2002-04-01), Rostoker et al.
patent: 6380614 (2002-04-01), Higuchi et al.
patent: 6424223 (2002-07-01), Wang et al.
patent: 6442321 (2002-08-01), Berini
patent: 6459084 (2002-10-01), Boreman et al.
patent: 6512431 (2003-01-01), Pergande
patent: 6542720 (2003-04-01), Tandy
patent: 6563185 (2003-05-01), Moddel et al.
patent: 6614960 (2003-09-01), Berini
patent: 2002/0145566 (2002-10-01), Ballantine et al.
patent: 2003/0059147 (2003-03-01), Berini
patent: 2003/0179974 (2003-09-01), Estes et al.
patent: 2150382 (1985-06-01), None
John G. Simmons, Electric Tunnel Effect between Dissimilar Electrodes Separated by a Thin Insulating Film, Sep. 1993, Journal of Applied Physics, V34, p. 2581.
S. R. Pollack and C. E Morris, Electron Tunneling through Asymmetric Films of Thermally Grown Al2O3, May 1964, Journal of Applied Physics, V35, N5, p. 1503-1513.
L. O. Hocker, D. R. Sokoloff, V. Daneu, A. Szoke, and A. Javan, Frequency Mixing in the Infrared and Far-Infrared using a Metal-to-Metal Point Contact Diode, Jun. 15, 1968, American Institute of Physics, V 12, N 12, p. 401-402.
S. M. Faris, T. Kenneth Gustafson, and John C. Wiesner, Detection of Optical Infrared Radiation with DC-Biased Electron-Tunneling Metal-Barrier-Metal Diodes, Jul. 1973, IEEE Journal of Quantum Electronics, V QE-9, N 7, p. 737-745.
C. Fumeaux, W. Hermann, F. K. Kneubuhl, and H. Rothuizen, Nanometer Thin-Film Ni-NiO-Ni Diodes for Detection and Mixing of 30 THz Radiation, Jul. 1998, Infrared Physics and technology, V 39, 123-183.
B. Michael Kale, Electron Tunneling Devices in Optics, Mar. 1985, Optical Engineering, V 24, N 2, p. 267-274.
G. Papp, M. DiVentra, C. Coluzza, A. Baldereschi, and G. Margaritondo, Current Rectification through a Single-Barrier Resonant Tunneling Quantum Structure, 1995, Superlattices and Microstructures, V 17, N 3, p. 273-275.
Alexander Korotkov and Konstantin Likharev, Resonant Fowler-Nordheim Tunneling through Layered Tunnel Barriers and its Possible Applications, Mar. 1999, International Electron Device Meeting Technical Digest.
T. Suemasu et al, Metal (CoSi2)/Insulator (CaF2) Resonant Tunneling Diode, Jan. 1994, Jpn. Journal of Applied Physics, V 33, p. 57-65.
M. Asada, K. Osada, and W. Saitoh, Theoretical Analysis and Fabrication of Small Area Metal/Insulator Resonant Tunneling Diode Integrated with Patch Antenna for Terahertz Photon Assisted Tunneling, 1998, Solid State Electronics, V 42, N7-8, p. 1543-1546.
Aleksanyan et al, Feasibility of Developing a Tunable Oscillator Utilizing a System of Metal-Barrier-Metal-Barrier-Metal Junctions, May 1981, Sov. J Quantum Electron, vol. 11, No. 5, pp. 635-637.
Aleksanyan et al, Generation of Electromagnetic Oscillations in Metal-Barrier-Metal-Barrier-Metal Structures, Aug. 1982, Sov. J. Quantum Electron., vol. 12, No. 8, pp. 1090-1092.
Belenov et al, Amplification of Plasma Oscillations in Complex Metal-Barrier-Metal Structures, Jul. 1982, Sov. J. Quantum Electron., vol. 12, No. 7, pp. 930-931.
Belenov et al, Investigation of the Radiation Emitted by Metal-Barrier-Metal Structures, Apr. 1983, Sov. J. Quantum Electron., vol. 13, No. 4, pp. 451-455.
Belenov et al, Angular Distribution of the Luminescence Emitted by a Metal-Barrier-Metal Diode, May 1985, Sov. J. Quantum Electron., vol. 15, No. 5, pp. 735-737.
Belenov et al, Resonant Tunneling in Multilayer Structures in the Presence of Surface Electromagnetic Waves, Apr. 1986, Sov. Tech. Phys. Lett., vol. 12, No. 4, pp. 200-202.
Belenov et al, Emission of Surface Electromagnetic Waves in the Case of Resonance Tunneling of Electrons, oct. 1987, Sov. J. Quantum Electron., vol. 17, No. 10, pp. 1348-1352.
Bykovskii et al, Influence of the Boundary of a Metal Film on the Luminescence Intensity from a Metal-Barrier-Metal Structure, Sov. Phys. Tech. Phys., Aug. 1986, vol. 31, No. 8, pp. 980-981.
N. A. Janunts et al, Modulation of Light Radiation during Input into Waveguide by Resonance Excitation of Surface Plasmons, Jul. 16, 2001, Applied Physics Letters, V 79, No. 3, p. 299-301.
Korotkov et al, TASERs: Possible DC Pumped Terahertz Lasers Using Interwell Transitions in Semiconductor Heterostructures, Oct. 10, 1994, Applied Physics Letters, V 65, No. 15, p. 1865-1867.
H. Drexler et al, Photon-Assisted Tunneling in a Resonant Tunneling Diode: Stimulated Emission and Absorption in the THz Range, Nov. 6, 1995, Applied Physics Letters, V 67, No. 19, pp. 4102-4104.
K. Kempa et al, Towards Stimulated Generation of Coherent Plasmons in Nanostructures, Mar. 1, 1999, Journal of Applied Physics, V 85, No. 7, pp. 3708-3712.
M. Asada et al, Estimation of Interwell Terahertz Gain by Photon-assisted Tunneling Measurement in Triple-Barrier Resonant Tunneling Diodes, Jul. 31, 2000, Applied Physics Letters, V 77, No. 5, pp. 618-620.
A. Tredicucci et al, Surface Plasmon Quantum Cascade Lasers at λ˜μm, Oct. 9, 2000, Applied Physics Letter, V 77, No. 15, pp. 2286-2288.
R. Volkov et al, Tunneling-Assisted Photon Emission in MIM Junctions, Jun. 1991, Physics Stat Sol (b) 163.311.
D. Siu et al, Stimulated Electron Tunneling in Metal-Barrier-Metal Structures due to Surface Plasmons, Apr. 1, 1976, Applied Physics Letters, V 28, No. 7, pp. 407-410.
D. Drury et al, Theory of Infrared and Optical

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

High speed electron tunneling devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High speed electron tunneling devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High speed electron tunneling devices will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3613992

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.