High speed electromechanically driven test ahead

Details High speed electromechanically driven test ahead High speed electromechanically driven test ahead

2007-06-26

2007-06-26

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

10887965

ABSTRACT:
A method for testing an integrated circuit (IC) that includes a step of mechanically turning on off an electrical connection to a test pin disposed on an electronic test head. The method further includes a step of rotating a driving rod to engage a switching wheel or other similar means for turning on-off of an electrical connection.

REFERENCES:
patent: 6089124 (2000-07-01), Murphy
patent: 6696845 (2004-02-01), Kamata
patent: 6703825 (2004-03-01), Creek et al.
patent: 6836136 (2004-12-01), Aghaeepour

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