High speed dynamic run-out testing apparatus and method

Details High speed dynamic run-out testing apparatus and method High speed dynamic run-out testing apparatus and method

1997-07-09

1999-01-26

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324519, 324772, G01R 3106, G01R 3134, G01B 731

Patent

active

058642382

ABSTRACT:
A high speed dynamic run-out testing apparatus includes a drive source rotatable at a high speed and having an output shaft, a main shaft coupled coaxially with the output shaft of the drive source, a non-contact bearing for rotatably supporting the main shaft in a non-contact fashion, a testpiece carrier shaft provided on one side of the main shaft remote from the drive source for supporting a cylindrical testpiece mounted on such testpiece carrier shaft, and a non-contact displacement detector for measuring a displacement of the cylindrical testpiece.

REFERENCES:
patent: 2999981 (1961-09-01), Probert
patent: 4456874 (1984-06-01), Anderson
patent: 5134378 (1992-07-01), Twerdochlib
patent: 5187434 (1993-02-01), Ando
patent: 5262717 (1993-11-01), Bolegoh

Affiliated with

Also associated with

Rating

High speed dynamic run-out testing apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High speed dynamic run-out testing apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High speed dynamic run-out testing apparatus and method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1452942