Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-03-30
2010-06-08
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C375S372000
Reexamination Certificate
active
07734434
ABSTRACT:
In some embodiments an apparatus includes a higher order statistical signal processor to process a jittered digital signal, a diagonal line average unit to identify a distinct line in a signal output from the higher order statistical signal processor, and a peak detection unit to determine a peak value in response to an output of the diagonal line average unit and to provide a data rate signal as an output. Other embodiments are described and claimed.
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Han Kyung-tae
Tinsley Keith R.
Anderson Robert D.
Bui Bryan
Intel Corporation
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