Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate
2007-07-31
2007-07-31
Jeanglaude, Jean Bruner (Department: 2819)
Coded data generation or conversion
Converter calibration or testing
C341S155000, C341S144000, C341S148000
Reexamination Certificate
active
11368079
ABSTRACT:
Devices and methods to test high speed analog-to-digital and digital-to-analog signal converters are provided. According to one embodiment, a testing device can comprise an output, a mixer, and an input. The output can provide a signal, and the mixer can receive the signal and provide a test signal to a data converter having a sampling frequency. The test signal can be spectrally impure. The input can sample the data converter output at a frequency less the sampling frequency so that the data converter output is under sampled. According to another embodiment, a first set of data converters are tested to obtain a mapping function that relates dynamic specifications to device signatures. Then a second set of data converters can be tested and based on their device signatures mapped with the mapping function, dynamic specifications for the second set of data converters can be obtained. Other embodiments are also claimed and described.
REFERENCES:
patent: 5909186 (1999-06-01), Gohringer
patent: 6404371 (2002-06-01), Takahashi et al.
patent: 6476741 (2002-11-01), Cherubal et al.
patent: 6631273 (2003-10-01), Eswein et al.
patent: 6964004 (2005-11-01), Chatterjee et al.
patent: 2002/0133772 (2002-09-01), Voorakaranam et al.
patent: 2003/0093730 (2003-05-01), Halder et al.
patent: 2004/0148549 (2004-07-01), Voorakaranam et al.
McLeod, D.A.; Dynamic Testing of Analogue to Digital Converters; International Conference on Analogue to Digital and Digital to Analogue Conversion, Sep. 17-19, 1991, pp. 29-35.
Mielke, J.A.; Frequency Domain Testing of ADCs; IEEE Design & Test of Computers, vol. 13 , No. 1 , Spring 1996, pp. 64-69, 0740-7475/96.
Yuan Tzu TIng, Li Wei Chao, Wei Chung Chao; A Practical Implementation of Dynamic Testing of an AD Converter; Proceedings of the Fifth Asian Test Symposium, Nov. 20-22, 1996, pp. 238-243; 1081-7735/96.
Yamaguchi, T., and Soma, M.; Dynamic Testing of ADCs Using Wavelet Transforms; International Test Conference, Nov. 1-6, 1997, pp. 379-388; 0-7803-4209-7/97 (Paper 16.1).
P.N. Variyam and Abhijit Chatterjee; Enhancing Test Effectiveness For Analog Circuits Using Synthesized Measurements; Proc. VLSI Test Symposium, 1998, pp. 132-137.
Dallas Semiconductor Maxim Application Note 728, Defining and Testing Dynamic Parameters in High-Speed ADCs, Part 1; Feb. 13, 2001; pp. 1-12; http://www.maxim-ic.com/appnotes.cfm/ appnote—number/728 and www.maxim-ic.com/an728.
P.N. Variyam et. al.; Prediction of Analog Performance Parameters Using Fast Transient Testing; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 21, No. 3, Mar. 2002; pp. 349-361; 0278-0070/02.
Srinivasan, G., Goyal, S., Chatterjee, A.; Reconfiguration for Enhanced Alternate Test (REALTest) of Analog Circuits; Proceedings of the 13th Asian Test Symposium of the IEEE Computer Society, Jan. 2004; 0-7695-2235-1/04.
Zhongjun Yu, Degang Chen, Geiger R.; Accurate Testing of ADC's Spectral Performance Using Imprecise Sinusoidal Excitations; Proceedings of the 2004 International Symposium on Circuits and Systems, vol. 1, May 23-26, 2004, pp. 645-648; 0-7803-8251-X/04.
J. H. Friedman; Multivariate Adaptive Regression Splines; The Annals of Statistics, vol. 19, No. 1, Mar. 1991, pp. 1-67.
Chatterjee Abhijit
Goyal Shalabh
Georgia Tech Research Corporation
Jeanglaude Jean Bruner
Schneider Ryan A.
Troutman Sanders LLP
Yancey, Jr. James Hunt
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