Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent
1995-06-14
1996-04-23
Tran, Toan
Electricity: measuring and testing
Conductor identification or location
Inaccessible
327 91, 327203, H03K 522, H03K 3289
Patent
active
055107346
ABSTRACT:
In a comparator including a first differential amplifier stage for amplifying the difference in potential between input signals, a second differential amplifier stage for amplifying the difference in potential between output signals of the first differential amplifier stage, and a latch stage for positively feeding output signals of the second amplifier stage back thereto, a first differential switch circuit alternately activates the second differential amplifier stage and the latch stage, and a second differential switch circuit alternately activates the first differential amplifier stage and the latch stage.
REFERENCES:
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patent: 5001361 (1991-03-01), Tamamura et al.
patent: 5196742 (1993-03-01), McDonald
patent: 5287016 (1994-02-01), Dansky et al.
patent: 5347175 (1994-09-01), Lang et al.
M. Hotta et al., "A 150-mW 8-Bit Video-Frequency A/D Converter", IEEE Journal of Solid-State Circuits, vol. SC-21, No. 2, pp. 318-323, Apr. 26, 1986.
T. Wakimoto et al., "Si Bipolar 2-GHz 6-Bit Flash A/D Conversion LSI", IEEE Journal of Solid-State Circuits, vol. 23, No. 6, pp.1345-1350, Dec. 1988.
NEC Corporation
Tran Toan
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