Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-01-29
2010-02-16
Natalini, Jeff (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S548000, C324S678000
Reexamination Certificate
active
07663382
ABSTRACT:
Systems and methods according to aspects of the present invention are described. The systems and methods enable charging, soaking, and measuring of capacitors to be conducted quickly. Charging and soaking typically occurs in parallel and certain embodiments facilitate the measuring of capacitor leakage by sequentially disconnecting each capacitor and measuring the time for voltage on the capacitor to reach a predetermined threshold. Further, all capacitors can be disconnected from a charging source simultaneously and voltages can be measured for each capacitor simultaneously. Monitoring can be periodic in nature. Substantial time savings in the calculation device of leakage values and parameters can be attained.
REFERENCES:
patent: 4765184 (1988-08-01), Delatorre
patent: 5899923 (1999-05-01), Kroll et al.
patent: 6025567 (2000-02-01), Brooks
patent: 6737877 (2004-05-01), Hatton et al.
patent: 7015705 (2006-03-01), Inaba et al.
patent: 7078887 (2006-07-01), Eckhardt et al.
patent: 7148697 (2006-12-01), Doljack
patent: 2006/0186946 (2006-08-01), Hughes
Corulli Charles
Olmstead Gregory
Snow Donald B.
Dicke Billig & Czaja, PLLC
Natalini Jeff
Rudolph Technologies, Inc.
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