Optics: measuring and testing – Lamp beam direction or pattern
Patent
1991-09-30
1994-02-15
Rosenberger, Richard A.
Optics: measuring and testing
Lamp beam direction or pattern
2502019, G01J 100
Patent
active
052871657
ABSTRACT:
A new and improved adaptive optics wavefront tilt sensor having both very high sensitivity and wide dynamic range is presented. In accordance with this invention, distortion is induced in each subaperture beam by passing a high f-number beam through a field lens having large amounts of spherical aberration. The distortion provides transition from a wide dynamic range, low sensitivity wavefront tilt measurement to a narrow dynamic range, high sensitivity wavefront tilt measurement. This beam is then impinged on a single photodector which provides at least one electrical signal indicative of centroid position.
REFERENCES:
patent: 4141652 (1979-02-01), Feinleib
patent: 4725138 (1988-02-01), Wirth et al.
patent: 5083015 (1992-01-01), Witthoft et al.
Radau, Jr. Rudolph E.
Ulich Bobby L.
Hantis K. P.
Kaman Aerospace Corporation
Rosenberger Richard A.
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