High sensitivity slitless ion source mass spectrometer for...

Details High sensitivity slitless ion source mass spectrometer for... High sensitivity slitless ion source mass spectrometer for...

2008-09-23

2008-09-23

Berman, Jack I. (Department: 2881)

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

C250S281000, C250S285000, C250S299000

Reexamination Certificate

active

11354737

ABSTRACT:
A mass spectrometer includes a main magnet having spaced-apart polepieces which define a gap, the main magnet producing a magnetic field in the gap, an ion source to generate ions and to accelerate the ions into the magnetic field in the gap, the ion source located outside the gap, and an ion detector to detect a selected species of the ions generated by the ion source and deflected by the magnetic field. The ion detector is located in the gap at a natural focus point of the selected species of ions. The mass spectrometer may be used in a trace gas leak detector.

REFERENCES:
patent: 3277295 (1966-10-01), Briggs
patent: 3520176 (1970-07-01), Becker
patent: 3591827 (1971-07-01), Hall
patent: 3690151 (1972-09-01), Briggs
patent: 4155008 (1979-05-01), Janes et al.
patent: 4499752 (1985-02-01), Fruzzetti et al.
patent: 4735084 (1988-04-01), Fruzzetti
patent: 4761553 (1988-08-01), Juravic, Jr.
patent: 4773256 (1988-09-01), Saulgeot
patent: 4845360 (1989-07-01), Landfors
patent: 4943718 (1990-07-01), Haines et al.
patent: 5313061 (1994-05-01), Drew et al.
patent: 5352893 (1994-10-01), Freedman
patent: 5506412 (1996-04-01), Buttrill, Jr.
patent: 5625141 (1997-04-01), Mahoney et al.
patent: 5661229 (1997-08-01), Bohm et al.
patent: 5728929 (1998-03-01), Gevaud
patent: 6014892 (2000-01-01), Baret et al.
patent: 6286362 (2001-09-01), Coffman et al.
patent: 6541781 (2003-04-01), Benveniste et al.
Article by Philip T. Smith entitled “The Ionization of Helium, Neon, and Argon by Electron Impact”, published by Physical Review, vol. 36, Oct. 15, 1930, pp. 1293-1302.

Affiliated with

Also associated with

Rating

High sensitivity slitless ion source mass spectrometer for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High sensitivity slitless ion source mass spectrometer for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High sensitivity slitless ion source mass spectrometer for... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3943235