High sensitivity semiconductor strain gauge

Details High sensitivity semiconductor strain gauge High sensitivity semiconductor strain gauge

1974-09-25

1976-10-26

Myracle, Jerry W.

Measuring and testing

Ductility or brittleness

338 2, G01L 122

Patent

active

RE0290092

ABSTRACT:
A method and device for measuring strain in which the resistance of a layer of piezoelectric semiconductor material is measured across a dimension along which the resistance is strain sensitive by a gauge factor of at least 100.

REFERENCES:
patent: 3492513 (1970-01-01), Hollander, Jr. et al.

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