Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Reexamination Certificate
2006-07-25
2006-07-25
Lefkowitz, Edward (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
By loading of specimen
C073S760000, C338S047000, C338S099000, C338S114000
Reexamination Certificate
active
07080562
ABSTRACT:
A high-sensitivity pressure conduction sensor is presented. The present invention includes a pair of locally resilient conductive layers and a locally resilient pressure conduction composite disposed between and contacting both conductive layers. Alternate embodiments include at least three locally resilient conductive layers and at least two locally resilient pressure conduction composites, each having a critical percolation threshold. Each composite is disposed between and contacting two conductive layers in a multi-layer fashion. Other embodiments include a locally resilient pressure conduction composite, a flexible substrate completely surrounding the composite so as to seal it therein, and a pair of electrical leads contacting the composite and terminating outside of the flexible substrate. Pressure conduction composites are composed of a plurality of conductive particles electrically isolated within a non-conductive matrix. Conductive particles are loaded so as to have a volume fraction approaching the critical percolation threshold of the material system and exhibit a conductance that greatly increases with pressure. Sensors may be arranged to form one or more arrays including planar and conformal configurations. The present invention has immediate application in keyboards, intrusion systems, control systems, submarines, ships, sonobuoys, doors, and switches.
REFERENCES:
patent: 3806471 (1974-04-01), Mitchell
patent: 6323751 (2001-11-01), Duggal et al.
patent: 6411191 (2002-06-01), Shea et al.
patent: 6646540 (2003-11-01), Lussey
patent: WO 200079546 (2000-12-01), None
Hughes Eli
Knowles Gareth
Crilly, Esq. Michael
Kirkland, III Freddie
Lefkowitz Edward
QorTek, Inc.
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