High-sensitivity infrared polarimeter

Details High-sensitivity infrared polarimeter High-sensitivity infrared polarimeter

1987-05-04

1989-04-04

Howell, Janice A.

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

356367, 350370, G01J 404

Patent

active

048188816

ABSTRACT:
A sensitive infrared polarimeter that measures the amount of degree of rotation of the plane of polarization of plane polarized radiation after the radiation has passed through a wafer of cadmium sulfide. The wafer is placed in a relatively small magnetic field that is varied. Increased sensitivity is realized by using a chopping wheel to chop the laser beam, providing a reference frequency and by detecting the signals with a synchronous detector such as a lock-in amplifier to obtain high signal to noise ratios of the detected signal. The greater sensitivity of the high-sensitivity infrared polarimeter allows electronic carrier concentrations as low as 10.sup.15 cm.sup.-3 to be measured in cadmium sulfide with magnetic fields as low as 0.1 Tesla.

REFERENCES:
patent: 2976764 (1961-03-01), Hyde et al.
patent: 3740151 (1973-06-01), Chaney et al.
patent: 4048500 (1977-09-01), Moore
patent: 4504145 (1985-03-01), Koizumi
patent: 4585348 (1986-04-01), Chastang et al.
Dodel et al., "A Far-Infrared polar-Interferometer For Simultaneous Elect Density and Magnetic Field Measurements in Plasma", Infrared Physics, vol. 18, pp. 773-6.

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