Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1992-02-07
1994-07-12
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356318, 356301, G01J 328
Patent
active
053293533
ABSTRACT:
A compact, high sensitive, multi-wavelength spectral analyzer capable of simultaneously obtaining a spectral distribution of extremely weak radiation such as bioluminescence, chemiluminescence, extremely weak fluorescence caused by excitation light, Raman scattered light, etc. with an extremely high luminosity and without wavelength scanning. The spectral analyzer comprises a spectroscope and a high sensitive one- or two-dimensional photodetector. The spectroscope includes an entrance slit, a collimator lens of high luminosity disposed such that a focal point of the collimator lens is coincident with the entrance slit to convert light emerging therefrom into parallel rays, a reflection diffraction grating that diffracts the parallel rays from the collimator lens to produce spectra, and an imaging lens that focuses the parallel rays diffracted by the reflection diffraction grating on an image plane thereof to form a spectral image. The photodetector is disposed on the image plane of the imaging lens.
REFERENCES:
patent: 3600093 (1971-08-01), McMahon
patent: 4076421 (1978-02-01), Kishner
patent: 4973159 (1990-11-01), Sohm et al.
Ichimura Tsutomu
Inaba Fumio
Nogoshi Toshiyuki
Hantis K. P.
McGraw Vincent P.
Research Development Corp. of Japan
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